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Microscope or Measuring Machine? Both!
Watch our demo recording with features, software and best-practices.
Why splitting metrology and microscopy when you can do both on the same device? ZEISS O-INSPECT duo makes it possible and combines measuring machine and microscope in one device. In case you missed the product launch at the ZEISS Quality Innovation Days, watch the recording now to discover features, software examples and a statement from one of our pilot customers.
Watch the demo about ZEISS O-INSPECT duo here.
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